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CMC Conference 2017 Speaker Feedback
Thank you for taking our survey. All information is held in confidence and used for the purpose of improving our conference and content. The feedback the speakers will receive will be anonymous.
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Please indicate which materials area(s) are of interest to you (check all that apply.)
Bulk Gases
Ceramic / SiC / Si Equipment Components
CMP Consumables
Dielectric Precursors
Metal Chemicals (ECD, ELP, AgSn)
Metal Precursors
Quartz Equipment Components
Specialty Gases
Sputter Targets
Wafers
Wet Chemicals
Keynote
“‘Braking’ Through Barriers with Materials”
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Hans Stork, ON Semiconductor
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Session I: Global Issues & Supply-Chain Challenges
"Global MacroEconomics and Materials Trends"
- Scott Jones, KPMG
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"OEM Market Dynamics"
- Risto Puhakka, VLSI Research
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"Regulatory Challenges for Novel Engineered and Other Critical Materials"
- James Votaw, Keller & Heckman
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"Worldwide Electronics Supply and Demand for Gases"
- Jack Faught, Linde
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Session II: Immediate Challenges of Materials & Manufacturing
"300mm Wafer Production in China Meeting Demand"
- Richard Chang, Zing Semi.
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"Present and Future Challenges of Wafer Specifications"
- Rohit Takalkar, Samsung
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"Materials & Manufacturing Challenges of CVD SiC"
- Richard Hengst, CoorsTek
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"Supply Chain Issues and Changing Market Dynamics for Ceramic Consumables"
- Tim Dyer, TECHCET / Elcon
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"Fluorocarbons R&D for Technology and EHS"
- Nathan Stafford, Air Liquide
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"Creating a Robust and Sustainable Supply Chain for High Volume Cobalt Precursors"
- Oliver Briel, Ph.D., Umicore
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"High K Resources and the Global Supply Chain for Hf/Zr"
- Alister MacDonald, Alkane
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"CMP Slurry Recycling & Reuse Challenges and Strategies"
- Tito Tang, Cypress and Scott Ray, HighQ
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Session III: Emerging Materials Challenges
"Materials Process Challenges for Advanced Technology and the Role of Atomic Scale Precision"
- Eric Joseph, IBM
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"Welcome to the Atomic Scale: New Paradigms and Processes for Continued Scaling"
- Rob Clark, TEL
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"Dynamic Supply‐Chains for Memory – ALD Precursors"
- Jonas Sundqvist, Ph.D., Fraunhofer IKTS/TECHCET
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"DSA Material R&D with Extraordinary Batch Control"
- Darron Juradja, Brewer Science
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"Performance Impact of Critical Chemical Quality on Latest Technology Node"
- Nora Colligan, Samsung
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"Metrology Challenges in Controlling Liquids/Slurries"
- Jeff Hemphill, Intel
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Panel Discussion
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