ITC 2016 Panel 3 Test Cost Reduction—Is There More to Cut?

Question Title

* Moderator: H. Kobayashi, Gunma University

	Award Quality	Excellent	Good	Fair	Poor
Technical Content	Technical Content Award Quality	Technical Content Excellent	Technical Content Good	Technical Content Fair	Technical Content Poor
Interest	Interest Award Quality	Interest Excellent	Interest Good	Interest Fair	Interest Poor
Visual	Visual Award Quality	Visual Excellent	Visual Good	Visual Fair	Visual Poor
Verbal	Verbal Award Quality	Verbal Excellent	Verbal Good	Verbal Fair	Verbal Poor

Question Title

* Panelist 1: B. Bartlett, Advantest

	Award Quality	Excellent	Good	Fair	Poor
Technical Content	Technical Content Award Quality	Technical Content Excellent	Technical Content Good	Technical Content Fair	Technical Content Poor
Interest	Interest Award Quality	Interest Excellent	Interest Good	Interest Fair	Interest Poor
Visual	Visual Award Quality	Visual Excellent	Visual Good	Visual Fair	Visual Poor
Verbal	Verbal Award Quality	Verbal Excellent	Verbal Good	Verbal Fair	Verbal Poor

Question Title

* Panelist 2: W. Dobbelaere, ON Semiconductor

	Award Quality	Excellent	Good	Fair	Poor
Technical Content	Technical Content Award Quality	Technical Content Excellent	Technical Content Good	Technical Content Fair	Technical Content Poor
Interest	Interest Award Quality	Interest Excellent	Interest Good	Interest Fair	Interest Poor
Visual	Visual Award Quality	Visual Excellent	Visual Good	Visual Fair	Visual Poor
Verbal	Verbal Award Quality	Verbal Excellent	Verbal Good	Verbal Fair	Verbal Poor

Question Title

* Panelist 3: R. Knoth, Cadence

	Award Quality	Excellent	Good	Fair	Poor
Technical Content	Technical Content Award Quality	Technical Content Excellent	Technical Content Good	Technical Content Fair	Technical Content Poor
Interest	Interest Award Quality	Interest Excellent	Interest Good	Interest Fair	Interest Poor
Visual	Visual Award Quality	Visual Excellent	Visual Good	Visual Fair	Visual Poor
Verbal	Verbal Award Quality	Verbal Excellent	Verbal Good	Verbal Fair	Verbal Poor

Question Title

* Panelist 4: R. van Rijsinge, NXP Semiconductors

	Award Quality	Excellent	Good	Fair	Poor
Technical Content	Technical Content Award Quality	Technical Content Excellent	Technical Content Good	Technical Content Fair	Technical Content Poor
Interest	Interest Award Quality	Interest Excellent	Interest Good	Interest Fair	Interest Poor
Visual	Visual Award Quality	Visual Excellent	Visual Good	Visual Fair	Visual Poor
Verbal	Verbal Award Quality	Verbal Excellent	Verbal Good	Verbal Fair	Verbal Poor

Question Title

* Panelist 5: P. Sarson, ams

	Award Quality	Excellent	Good	Fair	Poor
Technical Content	Technical Content Award Quality	Technical Content Excellent	Technical Content Good	Technical Content Fair	Technical Content Poor
Interest	Interest Award Quality	Interest Excellent	Interest Good	Interest Fair	Interest Poor
Visual	Visual Award Quality	Visual Excellent	Visual Good	Visual Fair	Visual Poor
Verbal	Verbal Award Quality	Verbal Excellent	Verbal Good	Verbal Fair	Verbal Poor

Question Title

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