Exit this survey ITC 2016 Panel 3 Test Cost Reduction—Is There More to Cut? Question Title * Moderator: H. Kobayashi, Gunma University Award Quality Excellent Good Fair Poor Technical Content Technical Content Award Quality Technical Content Excellent Technical Content Good Technical Content Fair Technical Content Poor Interest Interest Award Quality Interest Excellent Interest Good Interest Fair Interest Poor Visual Visual Award Quality Visual Excellent Visual Good Visual Fair Visual Poor Verbal Verbal Award Quality Verbal Excellent Verbal Good Verbal Fair Verbal Poor Question Title * Panelist 1: B. Bartlett, Advantest Award Quality Excellent Good Fair Poor Technical Content Technical Content Award Quality Technical Content Excellent Technical Content Good Technical Content Fair Technical Content Poor Interest Interest Award Quality Interest Excellent Interest Good Interest Fair Interest Poor Visual Visual Award Quality Visual Excellent Visual Good Visual Fair Visual Poor Verbal Verbal Award Quality Verbal Excellent Verbal Good Verbal Fair Verbal Poor Question Title * Panelist 2: W. Dobbelaere, ON Semiconductor Award Quality Excellent Good Fair Poor Technical Content Technical Content Award Quality Technical Content Excellent Technical Content Good Technical Content Fair Technical Content Poor Interest Interest Award Quality Interest Excellent Interest Good Interest Fair Interest Poor Visual Visual Award Quality Visual Excellent Visual Good Visual Fair Visual Poor Verbal Verbal Award Quality Verbal Excellent Verbal Good Verbal Fair Verbal Poor Question Title * Panelist 3: R. Knoth, Cadence Award Quality Excellent Good Fair Poor Technical Content Technical Content Award Quality Technical Content Excellent Technical Content Good Technical Content Fair Technical Content Poor Interest Interest Award Quality Interest Excellent Interest Good Interest Fair Interest Poor Visual Visual Award Quality Visual Excellent Visual Good Visual Fair Visual Poor Verbal Verbal Award Quality Verbal Excellent Verbal Good Verbal Fair Verbal Poor Question Title * Panelist 4: R. van Rijsinge, NXP Semiconductors Award Quality Excellent Good Fair Poor Technical Content Technical Content Award Quality Technical Content Excellent Technical Content Good Technical Content Fair Technical Content Poor Interest Interest Award Quality Interest Excellent Interest Good Interest Fair Interest Poor Visual Visual Award Quality Visual Excellent Visual Good Visual Fair Visual Poor Verbal Verbal Award Quality Verbal Excellent Verbal Good Verbal Fair Verbal Poor Question Title * Panelist 5: P. Sarson, ams Award Quality Excellent Good Fair Poor Technical Content Technical Content Award Quality Technical Content Excellent Technical Content Good Technical Content Fair Technical Content Poor Interest Interest Award Quality Interest Excellent Interest Good Interest Fair Interest Poor Visual Visual Award Quality Visual Excellent Visual Good Visual Fair Visual Poor Verbal Verbal Award Quality Verbal Excellent Verbal Good Verbal Fair Verbal Poor Question Title * Please provide additional comments in this box Done