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ITC 2016 Panel 3 Test Cost Reduction—Is There More to Cut?
Moderator: H. Kobayashi, Gunma University
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Panelist 1: B. Bartlett, Advantest
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Panelist 2: W. Dobbelaere, ON Semiconductor
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Panelist 3: R. Knoth, Cadence
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Panelist 4: R. van Rijsinge, NXP Semiconductors
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Panelist 5: P. Sarson, ams
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