Exit this survey ITC 2016 Poster Session Question Title * Please select your favorite poster (up to three selections accepted) Poster 1.1: Double Pumped Memory Fault Modeling and TestS. Adham, J-D. Yu, A. Lai, H. Liao, C. O'Connell, TSMC Poster 1.2: Tester Performance Validation (TPV): Methods and Apparatus for Validating Adherence to Published Specs in the Tester Acceptance ProcessN. Magdaleno, M. Mohammed, Texas Instruments Poster 1.3: Does Your Locking SIB Have a Back Door?S. Kancharla, S. Gupta, J. Kayse, J. Dworak, D. Engels, Southern Methodist University; A. Crouch, SiliconAid Solutions Poster 1.4: Custom Logic BIST in Cutting-Edge SoC FPGA SystemsR. Rajanarayanan, N. Varma, Achronix Semiconductor; A. Cron, Synopsys Poster 1.5: Testing for Connectivity to DDR Memory at Board- and System-Level ; Challenges, Guidance and Success for Boundary-Scan-based MethodsA. Ley, ASSET InterTech Poster 1.6: Use EDT Dynamic Bandwidth Management to Reduce SoC PatternsK. Huang, B. Lu, T. Li, L. Xu, Spreadtrum Communications; Y. Huang, F. Meng, Mentor Graphics Poster 1.7: Fault-tolerant Photonic Router for Network-on-Chip with High ReliabilityD. Dang, P. Biswas, D. Walker, R. Mahapatra, Texas A&M University Poster 1.8: Diagnosing Cell Internal Defects for FinFET TechnologyH. Tang, W. Yang, M. Abdelwahid, D. Han, Samsung; S. Park, Mentor Graphics Poster 1.9: Exploit Faster-Than-At-Speed Functional Programs Execution for Burn-In TestA. Bosio, G. Di Natale, LIRMM - Universit de Montpellier II / CNRS; P. Bernardi, A. Guerriero, F. Venini, politecnico di torino Poster 1.10: Note on Critical-Area-aware Test Pattern Generation and ReorderingS. Inuyama, K. Iwasaki, Tokyo Metropolitan University; M. Arai, Nihon University Poster 1.11: Silicon Debug on ATE Using Protocol-aware JTAG-IJTAG EDA Software ToolsA. Crouch, J. Johnson, SiliconAid Solutions; N. Poulson, Advantest Poster 1.12: Assessing Diagnostic Coverage by Transient Fault Injection for ISO 26262J. Schat, NXP Semiconductors Poster 1.13: Uninterrupted Hardware DesignX. Qin, H. Li, Z. Wang, Huawei Poster 1.14: Improved Path Recovery in Pseudo Functional Path Delay Test Using Extended Value AlgebraD. Walker, P. Biswas, Texas A&M University Poster 1.15: ASICS End-to-End Automated Test Program Generation and Diagnostics EnablementD. Sprague, R. Bulaga, GLOBALFOUNDRIES Poster 1.16: Yield Improvement by Optimizing the Impedance of Power Delivery Network (PDN) on Device Interface Board (DIB)J. Shi, Spreadtrum Communications; Z. Chen, Y. Huang, Mentor Graphics; P. Zhang, Teradyne Poster 1.17: 1687.1 -- New Connections for a New StandardA. Crouch, J. Johnson, SiliconAid Solutions; M. Keim, Mentor Graphics Poster 1.18: Combining Channel Sharing and Hierarchical DFT Techniques to Address Pin-limited, Large SoC ChallengesZ. Zhang, L. Kong, K. Huang, B. Lu, Spreadtrum Communications; R. Fisette, F. Meng, Mentor Graphics Poster 1.19: A Smart Software Approach to Implement Real-Time Dynamic Part Average Testing in ProductionC. Tsao, Y-T. Hsu, Sigurd Microelectronics Poster 1.20: CloudTesting Service In Silicon Diagnostics A. Sivaram, O. Yasuji, Advantest; B. Zhang, D. Mark, J. Fan, Xilinx Poster 1.21: An IJTAG-compatible IDDT Embedded Instrument for Health Monitoring and PrognosticsH. Kerkhoff, A. Ibrahim, University of Twente Poster 1.22. ECU Testing with Adaptive Random WalksB. Fath, KIT; F. Gauterin, Karlsruhe Institute of Technology Poster 1.23. Test Matrix Architecture to Test and On-the-Fly Failure Isolation on multiple Instance of Heterogeneous CoresB. Konda, J. Udyavar, S. Ahmed, S. Kumar, GLOBALFOUNDRIES; M. Lakshmanan, Cadence Design Systems Poster 1.24, Scalable and Reusable Dependability Framework Based on IEEE 1687A. Ibrahim, H. Kerkhoff, University of Twente Question Title * General Comments Question Title * Name (Optional) Done