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2016 IEEE TTTC E. J. McCluskey Best Doctoral Thesis Award: Final Round
K. Huang, University of Texas at Dallas (Chair)
TC1 Memory Repair for High Fault Rates
P. Papavramidou, TIMA, Grenoble
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TC2 Output Bit Selection Methodology for Test Response Compaction
W-C. Lien, National Cheng Kung University
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TC3 Testing of Interposer-based 2.5D Integrated Circuits
R. Wang, Duke University
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