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ITC 2016 Session 16 - Test Generation
G. Maston, Synopsys (Chair)
T. Ayres, Synopsys (Discussant)
16.1: Transformation of Multiple Fault Models to a Unified Model for ATPG Efficiency Enhancement
C-H. Wu, National Cheng Kung University
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16.2: An Accurate Algorithm for Computing Mutation Coverage in Model Checking
H. Chao, State Key Laboratory of Computer Architecture, Institute of Computing Technology
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16.3: An On-Chip Self-Test Architecture with Test Patterns Recorded in Scan Chains
K-J. Lee, National Cheng Kung University
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