CAMECA Literature Request

CAMECA Information Request: APT

Thanks for requesting information on CAMECA instruments.

Here you'll learn about the instruments used in APT, SIMS, EPMA, Nu-MS and more, and can request additional information on the equipment and techniques.

To request information, simply check the instrument(s) you're interested in learning more about, provide us your mailing address, and we will send you the requested information as quickly as possible. And don't forget to select either a Periodic Table of the Elements or 50th Anniversary of Atom Probe poster!

Thanks again for your interest!

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* 1. Atom Probe Tomography (APT)

Atom Probe Tomography is a quantitiative technique that provides atomic scale 3D elemental mapping of chemical heterogeneities in materials. Typcial users of atom probe tomography include scientists and engineers interested in nanoscale compositional variations. Laser APT has proven effective in semiconductors, compound semiconductors, thin films and nanowires, ceramics and oxides as well as device structures. Metallurgical applications also benefit significantly from APT.

Please select the Atom Probe Tomography literature you would like to receive:

LEAP 5000. The Local Electrode Atom Probe (LEAP) makes use of a Local Electrode, which focuses electric fields on the sample tip, resulting in lower voltages on a fragile sample and higher yield, as well as allowing for the use of convenient microtip specimen coupons for conducting APT experiments in series.

EIKOS. The EIKOS has been designed for traditional APT applications (metals) and features lower cost of ownership.

Essential Knowledge Brief on Atom Probe Tomography. This guide provides a concise overview of atom probe tomography and how it can benefit your research and/or processes.

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* 2. Secondary Ion Mass Spectrometry (SIMS)

When a solid sample is sputtered by primary ions of few keV energy, a fraction of the particles emitted from the target are ionized. Secondary Ion Mass Spectrometry consists of analyzing these secondary ions with a mass spectrometer. Secondary ion emission by a solid surface under ion bombardment supplies information about the elemental, isotopic and molecular composition of its uppermost atomic layers. The secondary ion yields will vary greatly according to the chemical environment and the sputtering conditions (ion, energy, angle). This can add complexity to the quantitative aspect of the technique. SIMS is nevertheless recognized as the most sensitive elemental and isotopic surface analysis technique.

Please select the SIMS literature you would like to receive:

IMS 7f-Auto: CAMECA's universal SIMS: reference detection sensitivity with high throughput and full automation. Applications include semiconductors, microelectronics, LED, PV, material sciences.

IMS Wf-SC Ultra: High performance Magnetic Sector SIMS for advanced semiconductors. Applications include microelectronics, LED.

SIMS 4550: Quadropole SIMS Microprobe for dopant depth profiling and thin layer analysis in semiconductors. Applications include semiconductors, material sciences.

IMS 7f - GEO: High performance compact SIMS for Geoscience laboratories. Applications include geosciences; stable isotopes, trace element analyses, and material sciences.

IMS 1300 HR3: New generation Ion Microprobe for path-breaking advances in Geoscience; high reproducibility at high spatial
resolution and high mass resolution. Applications include geosciences; geochemistry, geochronology, cosmochemistry, trace element analyses, nuclear safeguards.

IMS 1300 HR3 KLEORA: Specialized Ion Microprobe for world-leading research in Geochronology. Applications include geosciences; geochemistry, geochronology, cosmochemistry, trace element analyses, nuclear safeguards.

NanoSIMS 50L: SIMS Microprobe for isotopic and trace element analysis at high spatial resolution. Applications include environmental microbiology, cosmochemistry, material sciences, geochemistry, and cell biology.

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* 3. Electron Probe MicroAnalysis (EPMA)

EPMA is a fully qualitative and quantitative method of non-destructive elemental analysis of micron-sized volumes at the surface of materials, with sensitivity at the level of ppm. Routine quantification to 1% reproducibility is obtained over several days. It is the most precise and accurate micro-analysis technique available and all elements from B to U and above can be analyzed.

Please select the EPMA literature you would like to receive:

SxFIVE: Electron Probe Micro Analyzer for Materials & Geosciences. Applications include mineralogy, geochronology, physical and nuclear metallurgy, material sciences, biochemistry, and microelectronics.

SxFive FE: Field Emission Electron Probe Micro Analyzer for quantitative analysis and X-ray mapping at the highest possible spatial resolution. Applications include mineralogy, geochronology, and material sciences.

SKAPHIA: Shielded Electron Probe MicroAnalyzer for radioactive samples. Nuclear applications include: study of the radiation damage processes in materials and complex micro-structures, analysis of materials for the nuclear fuel cycle, R&D of advanced alloys and innovative structural materials, nuclear reactor maintenance optimization, nuclear waste management.

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* 4. Would you like information on Nu Instruments' mass spectrometry technologies?

Yes, I'd like that information.

No thanks, I'm ready to request these materials.