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* S7.1: STTRAM Overview—Circuit and Architecture Perspective
H.Naeimi, Intel




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* S7.2: BIST Design for Characterization and Testing of Embedded STT-MRAM
S. Adham, TSMC

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* S7.3: Tailoring Design and Test Methodologies to Validate STT-MRAM as High-Performance Nonvolatile RAM
S. Kang, Qualcomm




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