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* 11.1: Mixed-Signal ATE Technology and Its Impact on Today's Electronic System Platforms
G. Roberts, McGill University

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* 11.2: Known-Good-Die Test Methods for Large, Thin, High-Power Digital Devices
D. Armstrong, Advantest

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* 11.3: Test-Time-efficient Group Delay Filter Characterization Technique Using a Discrete Chirped Excitation Signal
P. Sarson, ams

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