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ITC 2016 Session 2 - DFTPeter Wohl, Synopsys (Chair)Vivek Chickermane, Cadence (Discussant)

ITC 2016 Session 2 - DFT Peter Wohl, Synopsys (Chair) Vivek Chickermane, Cadence (Discussant)

2.1: Test Point Insertion in Hybrid Test Compression/LBIST Architectures J. Rajski, Mentor Graphics

2.2:&nbsp; A Unified Test and Fault-tolerant Multicast Solution for Network-on-Chip Designs D. Xiang, Tsinghua University

2.3: Putting Wasted Clock Cycles to Use: Enhancing Fortuitous Cell-aware Fault Detection with Scan Shift Capture F. Zhang, Southern Methodist University

2.4: Minimal-Area Test Points for Deterministic Patterns Y. Liu, University of Iowa

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