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ITC 2016 Session 8 - Analytics II
Y. Makris, University of Texas at Dallas (Chair)
A. Gattiker, IBM (Discussant)
8.1: What We Know After Twelve Years Developing and Deploying Test Data Analytics
K. Butler, Texas Instruments
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8.2: Supply-Voltage Optimization to Account for Process Variations in High-Volume Manufacturing Testing
K. Chakrabarty, Duke University
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8.3: Variation and Failure Characterization Through Pattern Classification of Test Data From Multiple Test Stages
C-K. Hsu, University of California, Santa Barbara
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