Question Title

* 9.1: Built-in Self-Test for Microelectrode-Dot-Array Digital Microfluidic Biochips
Z. Li, Duke University


  Award Quality Excellent Good Fair Poor
Technical Content
Interest
Visual
Verbal

Question Title

* 9.2: Online Slack-Time Binning for IO-Registered Die-to-Die Interconnects
S-Y Huang, National Tsing Hua University

  Award Quality Excellent Good Fair Poor
Technical Content
Interest
Visual
Verbal

Question Title

* 9.3: Anticipated Test Challenges of Emerging Devices
R. Aitken, ARM

  Award Quality Excellent Good Fair Poor
Technical Content
Interest
Visual
Verbal

Question Title

* Please provide additional comments in this box

T