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ITC 2016 Session 17 - Mixed Signal
L. Winemberg, NXP (Chair)
R. Parekhi, Texas Instruments India (Discussant)
17.1: Automated Measurement of Defect Tolerance in Mixed-Signal ICs
Presenter: S. Sunter, Mentor Graphics
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17.2: Automatic Test Signal Generation for Mixed-Signal Integrated Circuits Using Circuit Partitioning and Interval Analysis
A. Coyette, KU Leuven
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17.3: DE-LOC: Design Validation and Debugging with Limited Observation and Control, Pre- and Post-Silicon, for Mixed-Signal Systems
B. Muldrey, Georgia Institute of Technology
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