ITC 2016 Session 3 - Analog I
E. Basker, Texas Instruments (Chair)
H. Stratigopoulos, Sorbonne Universités (Discussant)
3.1: Analog Fault Coverage Improvement Using Final-Test Dynamic Part Average Testing
W. Dobbelaere, ON Semiconductor
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3.2: Effective DC Fault Models and Testing Approach for Open Defects in Analog Circuits
B. Esen, KU Leuven
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3.3: Fault Simulation for Analog Test Coverage
S. Natarajan, Intel
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