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* 3.1: Analog Fault Coverage Improvement Using Final-Test Dynamic Part Average Testing
W. Dobbelaere, ON Semiconductor

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* 3.2: Effective DC Fault Models and Testing Approach for Open Defects in Analog Circuits
B. Esen, KU Leuven

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* 3.3: Fault Simulation for Analog Test Coverage
S. Natarajan, Intel

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