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ITC 2016 Special Session 5 - mmWave ATE HVM Technology
B. Bartlett, Advantest Chair)

S5.1: Package Interconnect Options for mmWave Applications
T. Smith, Phoenix Test Arrays




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S5.2: Challenges with high volume mmWave test cells
J. Shelley, Xcerra

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S5.3: Advantest Millimeter Systems for Production
R. McAleenan, Advantest




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