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ITC 2016 Session 5 - Analytics I
S. Blanton, Carnegie-Mellon University (Chair)
J. Carulli, GLOBALFOUNDRIES (Discussant)
5.1: Statistical Outlier Screening As a Test Solution Health Monitor
D. Shaw, Texas Instruments
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5.2: Accurate Anomaly Detection Using Correlation-based Time-Series Analysis in a Core Router System
S. Jin, Duke University;
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5.3: Harnessing Process Variations for Optimizing Wafer-level Probe-Test Flow
A. Ahmadi, UT Dallas
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