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ITC 2016 Session 4 - Memory
V. Chandra, ARM (Chair)
R. Aitken, ARM (Discussant)
4.1: Defect Tolerance for CNFET-based SRAMs
T. Li, Spreadtrum Communications
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4.2: A Built-in Self-Repair Scheme for DRAMs with Spare Rows, Columns, and Bits
Y-X Chen, National Central University
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4.3: EMACS: Efficient MBIST Architecture for Test and Characterization of STT-MRAM Arrays
I. Yoon, Georgia Institute of Technology
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